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tests/tcg/multiarch: Make the system memory test work on big-endian 

Store the bytes in descending order on big-endian.
Invert the logic in the multi-byte signed tests on big-endian.
Make the checks in the multi-byte signed tests stricter.

Signed-off-by: Ilya Leoshkevich <iii@linux.ibm.com>
Reviewed-by: Alex Bennée <alex.bennee@linaro.org>
Message-Id: <20230511114651.439872-2-iii@linux.ibm.com>
Signed-off-by: Thomas Huth <thuth@redhat.com>
This commit is contained in:
Ilya Leoshkevich 2023-05-11 13:46:50 +02:00 committed by Thomas Huth
parent 970641de01
commit f8d7c90f83
1 changed files with 43 additions and 24 deletions
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67
tests/tcg/multiarch/system/memory.c
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@ -40,18 +40,21 @@ static void pdot(int count)
}
/*
* Helper macros for shift/extract so we can keep our endian handling
* in one place.
* Helper macros for endian handling.
*/
#define BYTE_SHIFT(b, pos) ((uint64_t)b << (pos * 8))
#define BYTE_EXTRACT(b, pos) ((b >> (pos * 8)) & 0xff)
#if __BYTE_ORDER__ == __ORDER_LITTLE_ENDIAN__
#define BYTE_SHIFT(b, pos) (b << (pos * 8))
#define BYTE_NEXT(b) ((b)++)
#elif __BYTE_ORDER__ == __ORDER_BIG_ENDIAN__
#define BYTE_SHIFT(b, pos) (b << ((sizeof(b) - 1 - (pos)) * 8))
#define BYTE_NEXT(b) (--(b))
#else
#error Unsupported __BYTE_ORDER__
#endif
/*
* Fill the data with ascending value bytes.
*
* Currently we only support Little Endian machines so write in
* ascending address order. When we read higher address bytes should
* either be zero or higher than the lower bytes.
* Fill the data with ascending (for little-endian) or descending (for
* big-endian) value bytes.
*/
static void init_test_data_u8(int unused_offset)
@ -62,14 +65,14 @@ static void init_test_data_u8(int unused_offset)
ml_printf("Filling test area with u8:");
for (i = 0; i < TEST_SIZE; i++) {
*ptr++ = count++;
*ptr++ = BYTE_NEXT(count);
pdot(i);
}
ml_printf("done\n");
}
/*
* Full the data with alternating positive and negative bytes. This
* Fill the data with alternating positive and negative bytes. This
* should mean for reads larger than a byte all subsequent reads will
* stay either negative or positive. We never write 0.
*/
@ -119,7 +122,7 @@ static void init_test_data_u16(int offset)
reset_start_data(offset);
for (i = 0; i < max; i++) {
uint8_t low = count++, high = count++;
uint16_t low = BYTE_NEXT(count), high = BYTE_NEXT(count);
word = BYTE_SHIFT(high, 1) | BYTE_SHIFT(low, 0);
*ptr++ = word;
pdot(i);
@ -139,9 +142,10 @@ static void init_test_data_u32(int offset)
reset_start_data(offset);
for (i = 0; i < max; i++) {
uint8_t b4 = count++, b3 = count++;
uint8_t b2 = count++, b1 = count++;
word = BYTE_SHIFT(b1, 3) | BYTE_SHIFT(b2, 2) | BYTE_SHIFT(b3, 1) | b4;
uint32_t b4 = BYTE_NEXT(count), b3 = BYTE_NEXT(count);
uint32_t b2 = BYTE_NEXT(count), b1 = BYTE_NEXT(count);
word = BYTE_SHIFT(b1, 3) | BYTE_SHIFT(b2, 2) | BYTE_SHIFT(b3, 1) |
BYTE_SHIFT(b4, 0);
*ptr++ = word;
pdot(i);
}
@ -160,13 +164,13 @@ static void init_test_data_u64(int offset)
reset_start_data(offset);
for (i = 0; i < max; i++) {
uint8_t b8 = count++, b7 = count++;
uint8_t b6 = count++, b5 = count++;
uint8_t b4 = count++, b3 = count++;
uint8_t b2 = count++, b1 = count++;
uint64_t b8 = BYTE_NEXT(count), b7 = BYTE_NEXT(count);
uint64_t b6 = BYTE_NEXT(count), b5 = BYTE_NEXT(count);
uint64_t b4 = BYTE_NEXT(count), b3 = BYTE_NEXT(count);
uint64_t b2 = BYTE_NEXT(count), b1 = BYTE_NEXT(count);
word = BYTE_SHIFT(b1, 7) | BYTE_SHIFT(b2, 6) | BYTE_SHIFT(b3, 5) |
BYTE_SHIFT(b4, 4) | BYTE_SHIFT(b5, 3) | BYTE_SHIFT(b6, 2) |
BYTE_SHIFT(b7, 1) | b8;
BYTE_SHIFT(b7, 1) | BYTE_SHIFT(b8, 0);
*ptr++ = word;
pdot(i);
}
@ -374,12 +378,20 @@ static bool read_test_data_s16(int offset, bool neg_first)
ml_printf("Reading s16 from %#lx (offset %d, %s):", ptr,
offset, neg_first ? "neg" : "pos");
/*
* If the first byte is negative, then the last byte is positive.
* Therefore the logic below must be flipped for big-endian.
*/
#if __BYTE_ORDER__ == __ORDER_BIG_ENDIAN__
neg_first = !neg_first;
#endif
for (i = 0; i < max; i++) {
int32_t data = *ptr++;
if (neg_first && data < 0) {
pdot(i);
} else if (data > 0) {
} else if (!neg_first && data > 0) {
pdot(i);
} else {
ml_printf("Error %d %c 0\n", data, neg_first ? '<' : '>');
@ -399,12 +411,20 @@ static bool read_test_data_s32(int offset, bool neg_first)
ml_printf("Reading s32 from %#lx (offset %d, %s):",
ptr, offset, neg_first ? "neg" : "pos");
/*
* If the first byte is negative, then the last byte is positive.
* Therefore the logic below must be flipped for big-endian.
*/
#if __BYTE_ORDER__ == __ORDER_BIG_ENDIAN__
neg_first = !neg_first;
#endif
for (i = 0; i < max; i++) {
int64_t data = *ptr++;
if (neg_first && data < 0) {
pdot(i);
} else if (data > 0) {
} else if (!neg_first && data > 0) {
pdot(i);
} else {
ml_printf("Error %d %c 0\n", data, neg_first ? '<' : '>');
@ -419,8 +439,7 @@ static bool read_test_data_s32(int offset, bool neg_first)
* Read the test data and verify at various offsets
*
* For everything except bytes all our reads should be either positive
* or negative depending on what offset we are reading from. Currently
* we only handle LE systems.
* or negative depending on what offset we are reading from.
*/
read_sfn read_sfns[] = { read_test_data_s8,
read_test_data_s16,